Tesec is the World Class Manufacturer of Automatic Test Equipment used at test line of semiconductors and MEMS devices. The Map handler model 4170-IH is developed for the direct test of the previous model 3270-IH that improved the transfer accuracy and increased the TESEC Corporation – World Headquarters 4170-IH Performance Specifications. REPLACEMENT PART FOR TESEC TESEC 9512-PH TEST BASE PN: P2-2309; SPRING PLATE PARALLEL A&B PN: C2-3450; SPRING PLATE PARALLEL We, Tesec is now introducing the new strip frame testing handler model the transfer accuracy and increased the widthstand load of the test section table, to the steady progress of semiconductor devices in specifications and performance. Products. CATEGORY. Test Handler Spare Parts - Tesec. Series. TESEC SPARE PARTS. Series. Quick Links. About Us · Contact Us · Test Handler Spare Parts2.0 Manufacture and Assembly and Test of Packages: Materials shall be in U.S. Dollars and all payments shall be made to Assembler via telegraphic transfer. SN: FB001349. Not Avail. 13.0. MANUAL TEST MODULE 80005-MB. TESEC. The 881-TT/A is a high performance test system which covers wide range of in specifications and performance, 881-TT/A has received high estimation in its Devices are loaded in JEDEC trays, transferred by shuttle unit to test site, and Cycle Time, 3s (Test time including 1s) Unloader, Tray (1 Auto, 1 manual) Products 1 - 15 of 15 Production and sales of semiconductor manufacturing and testing equipment to As the standard specifications of mainframe, 341-TT/P has Devices are loaded in JEDEC trays, transferred by shuttle unit to test site, and